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ANSTO's X-ray techniques support improvements in solar

Advanced X-ray techniques have revealed new structural details about the specific arrangement of atoms in conjugated polymers, an important class of materials that are used in LEDs, organic solar cells, transistors, sensors and thermoelectric power devices.

Infrared microspectroscopy

Infrared microspectroscopy

The Infrared Microspectroscopy beamline combines the high brilliance and collimation of the synchrotron beam through a Bruker V80v Fourier Transform Infrared (FTIR) spectrometer and into a Hyperion 3000 IR microscope to reach high signal-to-noise ratios at diffraction limited spatial resolutions between 3-8 μm.

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Publications

Publications and resources from the Powder Diffraction beamline.

Pagination